S+S Inspection To Launch Two New Inspection Systems At PACK EXPO

On Booth 5472 AT PACK EXPO Las Vegas, S+S Inspection will be demonstrating its broad contamination detection and removal capability. New products will include the totally redesigned RAYCON X-ray product inspection system using the latest low energy X-ray source and sophisticated image processing software to identify metallic and non-metallic contamination, flavor clumps and missing components at a rate of up to 600 items per minute. The new RAYCON is ideal for end of line and in process inspection of a wide range of packed products, especially in the food industry where product inspection must be totally effective.

Also new is the GHF tunnel metal detector shown mounted on the S+S SANICON conveyor system, an ideal configuration for use in a wide variety of metal detection applications. The well proven GENIUS+ control system is fully integrated into the detector housing to provide a smooth, modern appearance, which is simple and quick to clean.

S+S Inspection Inc.
Chicago based S+S Inspection Inc. is part of the S+S Separation and Sorting Technology group, one of the leading metal detection and material sorting and separation companies in the world.

For the past 30 years, S+S has worked with clients in a wide range of industries developing practical and cost-effective solutions to product inspection, metal detection and contaminant removal problems using innovative and reliable technology. With many thousands of metal detection and separation systems installed worldwide, S+S is one of the leading manufacturers and the only one with such a wide and flexible product range.

Using the extensive technical resources at the Chicago US head office, the German parent and subsidiary companies throughout the world, S+S engineers can evaluate even the most difficult applications and provide customers with realistic performance estimates. Whether end of line or in process materials inspection, S+S can provide a definitive and cost effective solution whatever the application problem.

SOURCE: S+S Inspection